SPIE Proceedings [SPIE Intelligent Systems and Smart...

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SPIE Proceedings [SPIE Intelligent Systems and Smart Manufacturing - Boston, MA (Sunday 5 November 2000)] Process Imaging for Automatic Control - Augmented-reality visualization of fluid mixing in stirred chemical reactors using electrical resistance tomography (ERT)

Mann, Reg, Stanley, S. J., Vlaev, D., Wabo, E., Primrose, K., McCann, Hugh, Scott, David M.
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Volume:
4188
Year:
2001
Language:
english
DOI:
10.1117/12.417167
File:
PDF, 1.49 MB
english, 2001
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