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SPIE Proceedings [SPIE International Conference on Optoelectronic Information Technologies - Vinnytsia, Ukraine (Monday 2 October 2000)] Selected Papers from the International Conference on Optoelectronic Information Technologies - Intellectual device for granulametrical analysis
Bilyi, Olexander I., Yaremyk, Roman Y., Ferensovich, Yaroslav P., Svechnikov, Sergey V., Kojemiako, Volodymyr P., Kostyukevych, Sergey A.Volume:
4425
Year:
2001
Language:
english
DOI:
10.1117/12.429777
File:
PDF, 107 KB
english, 2001