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SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 29 July 2001)] Materials for Infrared Detectors - High-sensitivity (25-μm pitch) microbolometer FPAs
Murphy, Daniel F., Ray, Michael, Wyles, Richard, Asbrock, James F., Lum, Nancy A., Kennedy, Adam, Wyles, Jessica, Hewitt, C., Graham, Glen E., Horikiri, Tad, Anderson, John S., Bradley, Daryl, Chin, RVolume:
4454
Year:
2001
Language:
english
DOI:
10.1117/12.448169
File:
PDF, 937 KB
english, 2001