SPIE Proceedings [SPIE Intelligent Systems and Advanced Manufacturing - Boston, MA (Sunday 28 October 2001)] Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology II - Surface profile measurement of specular objects by grating projection method
Yamamoto, Masayuki, Tonooka, Masahito, Yoshizawa, Toru, Harding, Kevin G., Miller, John W. V.Volume:
4567
Year:
2002
Language:
english
DOI:
10.1117/12.455240
File:
PDF, 694 KB
english, 2002