SPIE Proceedings [SPIE Optomechatronic Systems III -...

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SPIE Proceedings [SPIE Optomechatronic Systems III - Stuttgart, Germany (Tuesday 12 November 2002)] Optomechatronic Systems III - Measuring system for micro radius of curvature

Narumi, Tatsuya, Nakamura, Taizo, Ichihara, Yasushi, Saruki, Yoshio, Miyakura, Jyota, Yoshizawa, Toru
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Volume:
4902
Year:
2002
Language:
english
DOI:
10.1117/12.467250
File:
PDF, 794 KB
english, 2002
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