SPIE Proceedings [SPIE Optical Metrology - Munich, Germany...

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SPIE Proceedings [SPIE Optical Metrology - Munich, Germany (Monday 23 June 2003)] Optical Measurement Systems for Industrial Inspection III - Difference displacement measurement using digital holograms as coherent masks

Gombkoto, Balazs, Osten, Wolfgang, Kujawinska, Malgorzata, Kornis, Janos, Fuzessy, Zoltan, Creath, Katherine, Rozsa, Tamas
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Volume:
5144
Year:
2003
Language:
english
DOI:
10.1117/12.499794
File:
PDF, 2.63 MB
english, 2003
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