SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, California, USA (Sunday 3 August 2003)] Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies - Photothermal microscopy and laser damage in optical components
Commandre, Mireille J., Duparre, Angela, Singh, Bhanwar, Natoli, Jean Yves, Amra, Claude, During, Annelise, Gallais, LaurentVolume:
5188
Year:
2003
DOI:
10.1117/12.505890
File:
PDF, 782 KB
2003