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SPIE Proceedings [SPIE Optical Science and Technology, SPIE's 48th Annual Meeting - San Diego, California, USA (Sunday 3 August 2003)] X-Ray and Gamma-Ray Instrumentation for Astronomy XIII - Positional accuracy as a measure of Chandra's optical distortions
Beckerman, Eli, Aldcroft, Tom, Gaetz, Terrance J., Jerius, Diab H., Nguyen, Dan, Tibbetts, MichaelVolume:
5165
Year:
2003
Language:
english
DOI:
10.1117/12.509381
File:
PDF, 512 KB
english, 2003