![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Defense and Security - Orlando, FL (Monday 12 April 2004)] Optical Pattern Recognition XV - Enhanced projection slice theorem synthetic discriminant functions based on the Karhunen-Loeve transform with application to the protein structure identification in cryo-electron microscopic images
Riasati, Vahid R., Casasent, David P., Chao, Tien-Hsin, Zhou, HuiVolume:
5437
Year:
2004
Language:
english
DOI:
10.1117/12.547154
File:
PDF, 220 KB
english, 2004