SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications X - Integration of segmented 3D image data measured by projected fringe profilometry
Su, Wei-Hung, Hsu, Yi-Ling, Kuo, Cho-Yo, Chen, Hung-Ming, Yu, Francis T. S., Guo, Ruyan, Yin, ShizhuoVolume:
5560
Year:
2004
Language:
english
DOI:
10.1117/12.559779
File:
PDF, 1.72 MB
english, 2004