SPIE Proceedings [SPIE Optical Science and Technology, the...

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SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] X-Ray Sources and Optics - Synchrotron x-ray study of multilayers in Laue geometry

Kang, Hyon Chol, MacDonald, Carolyn A., Macrander, Albert T., Stephenson, Gregory B., Liu, Chian, Ishikawa, Tetsuya, Morawe, Christian, Conley, Ray, Macrander, Albert T., Wood, James L., Maser, Jorg,
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Volume:
5537
Year:
2004
Language:
english
DOI:
10.1117/12.560173
File:
PDF, 213 KB
english, 2004
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