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SPIE Proceedings [SPIE OE/LASE '92 - Los Angeles, CA (Sunday 19 January 1992)] Laser Diode Technology and Applications IV - Characteristics and reliability of high temperature strained quantum well lasers
Hong, Chi-Shain, Fu, Richard J., Figueroa, Luis, Renner, Daniel S.Volume:
1634
Year:
1992
Language:
english
DOI:
10.1117/12.59166
File:
PDF, 201 KB
english, 1992