SPIE Proceedings [SPIE Electronic Imaging 2006 - San Jose, CA (Sunday 15 January 2006)] Optical Security and Counterfeit Deterrence Techniques VI - Sub-pixel analysis to support graphic security after scanning at low resolution
Haas, Bertrand, van Renesse, Rudolf L., Cordery, Robert, Gou, Hongmei, Decker, SteveVolume:
6075
Year:
2006
Language:
english
DOI:
10.1117/12.641516
File:
PDF, 765 KB
english, 2006