SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 3 April 2006)] Semiconductor Lasers and Laser Dynamics II - Reliability of InGaN laser diodes grown on low dislocation density bulk GaN substrates
Marona, L., Lenstra, Daan, Pessa, Markus, Wisniewski, P., Prystawko, P., White, Ian H., Porowski, S., Suski, T., Leszczynski, M., Grzegory, I., Czernecki, R., Perlin, P., Riemann, T., Christen, J.Volume:
6184
Year:
2006
Language:
english
DOI:
10.1117/12.662327
File:
PDF, 248 KB
english, 2006