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SPIE Proceedings [SPIE 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies - Xian, China (Wednesday 2 November 2005)] 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment - Study of low-contrast tracking based on wavelet transform
Xu, Ke-bao, Hou, Xun, Yuan, Jiahu, Liu, Rui-ying, Li, Ming-jun, Wyant, James C., Wang, Hexin, Zeng, Qing-liang, Han, SenVolume:
6150
Year:
2005
Language:
english
DOI:
10.1117/12.676484
File:
PDF, 321 KB
english, 2005