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SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 26 August 2007)] Applications of Digital Image Processing XXX - Image blur analysis for the subpixel-level measurement of in-plane vibration parameters of MEMS resonators
Le, Ha Vu, Tescher, Andrew G., Gouiffes, Michele, Parrain, Fabien, Bosseboeuf, Alain, Zavidovique, BertrandVolume:
6696
Year:
2007
Language:
english
DOI:
10.1117/12.733533
File:
PDF, 1.09 MB
english, 2007