SPIE Proceedings [SPIE Electronic Imaging 2008 - San Jose,...

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SPIE Proceedings [SPIE Electronic Imaging 2008 - San Jose, CA (Sunday 27 January 2008)] Image Processing: Algorithms and Systems VI - An artificial neural network based matching metric for iris identification

Broussard, Randy P., Astola, Jaakko T., Egiazarian, Karen O., Kennell, Lauren R., Ives, Robert W., Dougherty, Edward R., Rakvic, Ryan N.
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Volume:
6812
Year:
2008
Language:
english
DOI:
10.1117/12.766725
File:
PDF, 198 KB
english, 2008
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