SPIE Proceedings [SPIE Electronic Imaging 2008 - San Jose, CA (Sunday 27 January 2008)] Image Processing: Algorithms and Systems VI - An artificial neural network based matching metric for iris identification
Broussard, Randy P., Astola, Jaakko T., Egiazarian, Karen O., Kennell, Lauren R., Ives, Robert W., Dougherty, Edward R., Rakvic, Ryan N.Volume:
6812
Year:
2008
Language:
english
DOI:
10.1117/12.766725
File:
PDF, 198 KB
english, 2008