SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida (Monday 5 April 2010)] Independent Component Analyses, Wavelets, Neural Networks, Biosystems, and Nanoengineering VIII - Variable patch sizes for normalized cross correlation in image pairs
Wang, Jiaqin, Szu, Harold H., Agee, F. Jack, Pratt, Michael A., Chu, Chee-hung HenryVolume:
7703
Year:
2010
Language:
english
DOI:
10.1117/12.853683
File:
PDF, 3.42 MB
english, 2010