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SPIE Proceedings [SPIE SPIE Photonics Europe - Brussels, Belgium (Monday 12 April 2010)] Optical Micro- and Nanometrology III - Optical coherent sensor for monitoring and measurement of engineering structures
Łukaszewski, Dariusz, Gorecki, Christophe, Asundi, Anand K., Sałbut, Leszek, Dziuban, Jan A., Osten, WolfgangVolume:
7718
Year:
2010
Language:
english
DOI:
10.1117/12.854868
File:
PDF, 1.09 MB
english, 2010