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SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology - Data processing based on 3D measurement system using disparity method
Yang, Shuping, Jiang, Ya-Dong, Kippelen, Bernard, Yu, JunshengVolume:
7658
Year:
2010
Language:
english
DOI:
10.1117/12.867243
File:
PDF, 1.58 MB
english, 2010