SPIE Proceedings [SPIE Speckle 2010 - Florianapolis, Brazil (Monday 13 September 2010)] Speckle 2010: Optical Metrology - Aspects of speckle contrast metrology
Tchvialeva, L., Albertazzi Goncalves, Jr., Armando, Kaufmann, Guillermo H., Markhvida, I., Lee, T. K.Volume:
7387
Year:
2010
Language:
english
DOI:
10.1117/12.870674
File:
PDF, 537 KB
english, 2010