SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida, United States (Monday 25 April 2011)] Micro- and Nanotechnology Sensors, Systems, and Applications III - Integrated microsystems for molecular pathology
Scherer, Axel, Maltezos, George, Malik, Imran, Kartalov, EmilVolume:
8031
Year:
2011
Language:
english
DOI:
10.1117/12.885132
File:
PDF, 605 KB
english, 2011