SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 21 August 2011)] Infrared Sensors, Devices, and Applications; and Single Photon Imaging II - Cryogenic focal plane flatness measurement with optical zone slope tracking
Edelstein, Jerry, LeVan, Paul D., Sood, Ashok K., Sirk, Martin, Jelinsky, Patrick N., Wijewarnasuriya, Priyalal S., Razeghi, Manijeh, Besuner, Robert W., Hoff, Matthew, Pau Vizcaíno, Jose Luis, SudharVolume:
8155
Year:
2011
Language:
english
DOI:
10.1117/12.892521
File:
PDF, 2.66 MB
english, 2011