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SPIE Proceedings [SPIE IS&T/SPIE Electronic Imaging - Burlingame, California, United States (Sunday 22 January 2012)] Sensors, Cameras, and Systems for Industrial and Scientific Applications XIII - Accurate color with increased sensitivity using IR
Widenhorn, Ralf, Enge, Amy, DiBella, James, Nguyen, Valérie, Dupret, AntoineVolume:
8298
Year:
2012
Language:
english
DOI:
10.1117/12.911281
File:
PDF, 5.73 MB
english, 2012