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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] Reflection, Scattering, and Diffraction from Surfaces III - Effects of a measurement floor on Mueller matrix measurements in a DRR BSDF system

Nauyoks, Stephen E., Marciniak, Michael A., Hanssen, Leonard M.
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Volume:
8495
Year:
2012
Language:
english
DOI:
10.1117/12.929915
File:
PDF, 277 KB
english, 2012
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