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SPIE Proceedings [SPIE Semiconductor Conferences - Bay Point, FL (Monday 23 March 1987)] Modern Optical Characterization Techniques for Semiconductors and Semiconductor Devices - Photoreflectance Spectroscopy Studies Of Alloy Compositions And Ion Implant Damage In Zincblende-Type Semiconductors
Bowman, Jr., R. C., Alt, R. L., Brown, K. W., Glembocki, Orest J., Pollak, Fred H., Song, Jin-JooVolume:
794
Year:
1987
Language:
english
DOI:
10.1117/12.940898
File:
PDF, 461 KB
english, 1987