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SPIE Proceedings [SPIE 28th Annual Technical Symposium - San Diego (Tuesday 21 August 1984)] Stray Radiation IV - Comparison Of Roughness Measurements By Differential Scatter And Total Integrated Scatter
Stover, John C., Hourmand, Bahram, Kahler, Jeffrey A., Gillespie, Calvin H., Breault, Robert P.Volume:
511
Year:
1985
Language:
english
DOI:
10.1117/12.945027
File:
PDF, 221 KB
english, 1985