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SPIE Proceedings [SPIE 32nd Annual Technical Symposium - San Diego, CA (Monday 15 August 1988)] Current Developments in Optical Engineering III - A Vapor Leak Sensor Using Polarization Property For Plant Inspection
Nakajima, Toshiro, Kamei, Mitsuhito, Fischer, Robert E., Smith, Warren J.Volume:
965
Year:
1989
Language:
english
DOI:
10.1117/12.948012
File:
PDF, 2.52 MB
english, 1989