SPIE Proceedings [SPIE Soft X-Rays Optics and Technology - Berlin, Germany (Tuesday 8 December 1987)] Soft X-Ray Optics and Technology - Analytical Model For Transient Strehl Ratio Distribution In Soft X-Ray Optical Systems
Palmer, J. R., Koch, E., Schmahl, Guenther A.Volume:
733
Year:
1986
Language:
english
DOI:
10.1117/12.964908
File:
PDF, 307 KB
english, 1986