A Leader's Journey to Quality

Technometrics 1993 / 02 Vol. 35; Iss. 1

A Leader's Journey to Quality

Ziegel, Eric R., Cound, Dana
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Volume:
35
Language:
english
Journal:
Technometrics
DOI:
10.2307/1269322
Date:
February, 1993
File:
PDF, 336 KB
english, 1993
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