Measuring onion cultivars with image analysis using...

Measuring onion cultivars with image analysis using inflection points

Gerie W. A. M. Heijden, Albert M. Vossepoel, Gerrit Polder
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Volume:
87
Year:
1996
Language:
english
Pages:
13
DOI:
10.1007/bf00022960
File:
PDF, 895 KB
english, 1996
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