ChemInform Abstract: Effect of Polysilicon Gate...

ChemInform Abstract: Effect of Polysilicon Gate Pattern/Doping Sequence on Gate Oxide Degradation.

TAYLOR, M. A., FLOWERS, D. L., COSWAY, R.
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Volume:
19
Journal:
ChemInform
DOI:
10.1002/chin.198809397
Date:
March, 1988
File:
PDF, 116 KB
1988
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