ChemInform Abstract: Characterization of Polyphasic Silicon...

ChemInform Abstract: Characterization of Polyphasic Silicon Carbide Using Surface-Enhanced Raman and NMR Spectroscopy.

DANDO, N. R., TADAYYONI, M. A.
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Volume:
21
Journal:
ChemInform
DOI:
10.1002/chin.199043016
Date:
October, 1990
File:
PDF, 129 KB
1990
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