ChemInform Abstract: Characterization of Polyphasic Silicon Carbide Using Surface-Enhanced Raman and NMR Spectroscopy.
DANDO, N. R., TADAYYONI, M. A.Volume:
21
Journal:
ChemInform
DOI:
10.1002/chin.199043016
Date:
October, 1990
File:
PDF, 129 KB
1990