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3.1.2 System Verification and Validation through Reliability, Availability, Maintainability (RAM) Analysis & Technology Readiness Levels (TRLs)
Opare, Emmanuel Ohene, Park, CharlesVolume:
21
Language:
english
Journal:
INCOSE International Symposium
DOI:
10.1002/j.2334-5837.2011.tb01202.x
Date:
June, 2011
File:
PDF, 1.95 MB
english, 2011