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An improved linear modeling technique with sensitivity analysis for GaN HEMT
Luo, Danting, Shen, Li, Gao, JianjunYear:
2016
Language:
english
Journal:
International Journal of Numerical Modelling: Electronic Networks, Devices and Fields
DOI:
10.1002/jnm.2139
File:
PDF, 1.61 MB
english, 2016