Platinum and gold diffusion monitor vacancy profiles induced into silicon wafers by aluminum alloying
Abdelbarey, D., Kveder, V., Schröter, W., Seibt, M.Volume:
210
Language:
english
Journal:
physica status solidi (a)
DOI:
10.1002/pssa.201300020
Date:
April, 2013
File:
PDF, 451 KB
english, 2013