Analysis of threshold voltage instability in AlGaN/GaN MISHEMTs by forward gate voltage stress pulses
Winzer, Annett, Schuster, Martin, Hentschel, Rico, Ocker, Johannes, Merkel, Ulrich, Jahn, Andreas, Wachowiak, Andre, Mikolajick, ThomasVolume:
213
Language:
english
Journal:
physica status solidi (a)
DOI:
10.1002/pssa.201532756
Date:
May, 2016
File:
PDF, 1.26 MB
english, 2016