Use of dynamic compression to probe semiconductor response...

physica status solidi (b) 2013 / 04 Vol. 250; Iss. 4

Use of dynamic compression to probe semiconductor response at large strains

Grivickas, P., McCluskey, M. D., Gupta, Y. M.
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Volume:
250
Language:
english
Journal:
physica status solidi (b)
DOI:
10.1002/pssb.201200959
Date:
April, 2013
File:
PDF, 295 KB
english, 2013
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