Reliability Estimation for Products Subjected to Two-Stage...

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Quality and Reliability Engineering International 2016

Reliability Estimation for Products Subjected to Two-Stage Degradation Tests Based on a Gamma Convolution

Rodríguez-Picón, Luis Alberto, Méndez-González, Luis Carlos, Borbón, Manuel Iván Rodríguez, Valle, Arturo Del
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Year:
2016
Language:
english
Journal:
Quality and Reliability Engineering International
DOI:
10.1002/qre.1975
File:
PDF, 1.48 MB
english, 2016
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