Comparative study of the ToF-SIMS, FT-IR and XPS techniques...

Surface and Interface Analysis 2014 / 11 Vol. 46; Iss. S1

Comparative study of the ToF-SIMS, FT-IR and XPS techniques for quantitative analyses of mixed self-assembled monolayers

Son, Jin Gyeong, Shon, Hyun Kyong, Choi, Changrok, Han, Sang Woo, Lee, Tae Geol
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Volume:
46
Language:
english
Journal:
Surface and Interface Analysis
DOI:
10.1002/sia.5619
Date:
November, 2014
File:
PDF, 845 KB
english, 2014
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