TXRF intensity dependence on position of dried residue on...

X-Ray Spectrometry 2016 / 07 Vol. 45; Iss. 4

TXRF intensity dependence on position of dried residue on sample carrier and TXRF determination of halogen in liquid samples

Tabuchi, Yuri, Tsuji, Kouichi
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Volume:
45
Language:
english
Journal:
X-Ray Spectrometry
DOI:
10.1002/xrs.2688
Date:
July, 2016
File:
PDF, 862 KB
english, 2016
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