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A double-line image of a dislocation in a silicon single crystal observed by X-ray plane wave topography
Ishida, Kohtaro, Ootuka, Akio, Takagi, SatioVolume:
43
Language:
english
Journal:
Philosophical Magazine A
DOI:
10.1080/01418618108239503
Date:
April, 1981
File:
PDF, 889 KB
english, 1981