The effects of contamination on the electrical properties...

The effects of contamination on the electrical properties of edge dislocations in silicon

Glaenzer, R. H., Jordan, A. G.
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Volume:
18
Language:
english
Journal:
Philosophical Magazine
DOI:
10.1080/14786436808227495
Date:
October, 1968
File:
PDF, 542 KB
english, 1968
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