High-resolution x-ray spectra from highly charged Si, S and...

High-resolution x-ray spectra from highly charged Si, S and Cl ions showing evidence of fluorescence active resonant states

Kasthurirangan, S, Saha, J K, Agnihotri, A N, Banerjee, A, Kumar, A, Misra, D, Santos, J P, Costa, A M, Indelicato, P, Mukherjee, T K, TVibedi, L C
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Volume:
488
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/488/13/132027
Date:
April, 2014
File:
PDF, 97 KB
english, 2014
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