Using high energy diffraction microscopy to assess a model...

Journal of Physics Conference Series 2014 / 05 Vol. 500; Iss. 11

Using high energy diffraction microscopy to assess a model for microstructural sensitivity in spall response

Barton, N R, Rhee, M, Li, S F, Bernier, J V, Kumar, M, Lind, J F, Bingert, J F
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Volume:
500
Language:
english
Journal:
Journal of Physics: Conference Series
DOI:
10.1088/1742-6596/500/11/112007
Date:
May, 2014
File:
PDF, 4.32 MB
english, 2014
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