[IEEE 2003 American Control Conference, 2003. - Denver, Colorado, USA (4-6 June 2003)] Proceedings of the 2003 American Control Conference, 2003. - A general formulation for generating multi-rate models
Tomero, J., Armesto, L.Volume:
2
Year:
2003
Language:
english
DOI:
10.1109/acc.2003.1239742
File:
PDF, 312 KB
english, 2003