![](/img/cover-not-exists.png)
[IEEE 16th Asian Test Symposium (ATS 2007) - Beijing, China (2007.10.8-2007.10.11)] 16th Asian Test Symposium (ATS 2007) - Test Generation for Transistor Shorts using Stuck-at Fault Simulator and Test Generator
Higami, Yoshinobu, Saluja, Kewal K., Takahashi, Hiroshi, Kobayashi, Shin-ya, Takamatsu, YuzoYear:
2007
Language:
english
DOI:
10.1109/ats.2007.4388024
File:
PDF, 216 KB
english, 2007