[IEEE 2015 IEEE East-West Design & Test Symposium (EWDTS) - Batumi, Georgia (2015.9.26-2015.9.29)] 2015 IEEE East-West Design & Test Symposium (EWDTS) - The radiation-hardened instrumentation amplifier based on the differential difference operational amplifier for BiJFET technological process
Titov, A. E., Prokopenko, N. N., Zhebrun, E. A., Butyrlagin, N. V.Year:
2015
Language:
english
DOI:
10.1109/ewdts.2015.7493132
File:
PDF, 337 KB
english, 2015