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[IEEE 2015 IEEE International Integrated Reliability Workshop (IIRW) - South Lake Tahoe, CA (2015.10.11-2015.10.15)] 2015 IEEE International Integrated Reliability Workshop (IIRW) - Study of the impact of dielectric aging on coplanar waveguide performance
Nguyen, Anh Phuong, Luders, Ulrike, Voiron, FredericYear:
2015
Language:
english
DOI:
10.1109/iirw.2015.7437078
File:
PDF, 2.15 MB
english, 2015