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[IEEE 2015 IEEE International Memory Workshop (IMW) - Monterey, CA, USA (2015.5.17-2015.5.20)] 2015 IEEE International Memory Workshop (IMW) - In-Line-Test of Variability and Bit-Error-Rate of HfOx-Based Resistive Memory
Ji, B. L., Li, H., Ye, Q., Gausepohl, S., Deora, S., Veksler, D., Vivekanand, S., Chong, H., Stamper, H., Burroughs, T., Johnson, C., Smalley, M., Bennett, S., Kaushik, V., Piccirillo, J., Rodgers, M.Year:
2015
Language:
english
DOI:
10.1109/imw.2015.7150290
File:
PDF, 1.16 MB
english, 2015